The new veo 16:128 enables the end user technician to use 128 probe elements for inspection and makes it possible to connect to larger single probes or multiple probes.
This increase in power and capability is important for weld inspection applications, where a linear scan from both sides of the weld is needed. The new veo 16:128 can utilise a pair of 64-element probes, allowing inspection to be carried out in a single pass, improving both the speed of inspection; and positional accuracy since the two probes are linked together.
Efficient and effective scanning can also be achieved when the new veo is partnered with Sonatest’s large Wheel probe which is capable of scanning a strip of up to 100mm in a single pass. The system is Ideal for large area scanning applications and corrosion inspection.
Aerospace composite inspection applications are enhanced using the 128 element capability; as several inspection techniques for advanced materials such as GLARE have now been developed which require high resolution probes with 96 or 128 elements.
Further benefits to the new 16:128 veo include the capability of pitch-catch inspection techniques, merged c-scan inspections, top views and included UT Studio viewing and analysis software.
As with the 16:64 the menu system is intuitive and application and workflow driven, with set up and operation swiftly becoming second nature. Integrated Help and Wizards guide the user through scan set up whilst Optimisation Tips ensure the veo always performs at the highest level. Fast and efficient wizards for sound velocity, wedge delay, TCG, DAC, TOFD setup and Encoder calibration are all provided as standard.
The Inspection Plan shows the operator in 2D and 3D where probes are positioned on the test part, simplifying the inspection setup and providing an inspection reference for reporting. Using the latest computer technology data can be permanently recorded for processing and report generation.
veo 16:128 Specification
- Configuration 16:128 (16 pulser/receivers; driving up to 128 elements)
- Transducer Socket I-PEX
- Pulse Voltage -50 V to 130 V (in steps of 10 V)
- Edge Time <10ns in 50 ohms load @100V
- Output impedance <32 ohms
- Architecture Full digital delay and sum architecture
- Digitizing Frequency 50/100 MHz
- Digitizer Resolution 12 bits
- Data Processing 16 bits samples
- Data recording Full raw data recorded
- Max A-Scan Length 8192 samples (32 metres in steel LW, 50MHz, 1:128)
Scan & Views
- Supported Scans S-Scan & L-Scan
- Real Time Views S, L, B, C-Scan, Top and End view
- Colour Maps 10 Standards (Rainbow, Grayscale, Spectrum, Aeronautic or custom)
- Multi Group Multiple Sector scans and TOFD
Conventional UT/TOFD (Mono Element Channels)
- No. of Channels 2 TX/RX (2 multiplexed channels)
- Test Mode Pulse-Echo, transmit/receive, TOFD
- Bandwidth 200kHz – 18MHz (-3dB)
- Gain Range 102dB (-30dB to 72dB)
- Bandwidth 200kHz – 18MHz (-3dB)
- Filter Bands Narrow bands centred at 0.5 MHz, 1 MHz, 2.25 MHz, 5 MHz, 7.5MHz, 10 MHz and 15 MHz; Broadband at 1 MHz to 18 MHz (-6dB)
- DAC Quantity 1 with 3 sub-DAC (per focal law in PA)
- Time Corrected Gain (TCG)
- A-Scan Gates 4 gates per A-scan (3 extracted A-scans per S/L-scan)
- Gate Trigger Flank/Peak
- S/L-Scan 2 Extraction Box per S/L-scan
- Alarm LED 1 (sync on all gates & DACs)
- Measurements Available in A-Scan view
- 1D Peak (FSH, dB, D, BPL, SD)
- 1D Flank (FSH, dB, D, BPL, SD)
- Echo to Echo
- Data File Size 3GB
- Scanning Speed 10 – 15cm/s (3.9-5.9 in/s)